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CDT-NCHR
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CDT-NCHR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 400 225 - 610
Force Constant [N/m] 80 23 - 225
Length [µm] 125 115 - 135
Mean Width [µm] 30 22.5 - 37.5
Thickness [µm] 4 3 - 5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
CDT-NCHR-10 10 of all probes
CDT-NCHR-20 20 of all probes
CDT-NCHR-50 50
DT Diamond coated tip
DT Diamond coated tip
Raman spectrum of diamond coating
Raman spectrum of diamond coating
NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes

Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

NANOSENSORS™ CDT-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm. The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

  • real diamond coating, highly doped
  • AFM tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img


Jae Seok Nam, Weerawat To A Ran, Seok Hee Lee, Thuy Hoai Linh Vuong, Hannah Jo, Jung-Hun Lee, Soo Min Hwang, Young-Jun Kim
Densification and charge transport characterization of composite cathodes with single-crystalline LiNi0.8Co0.15Al0.05O2 for solid-state batteries
Energy Storage Materials, Volume 46, April 2022, Pages 155-164
DOI: https://doi.org/10.1016/j.ensm.2022.01.015


Ece N. Aybeke, Alexandra-Madalina Siladie, Rémy Vermeersch, Eric Robin, Oleksandr Synhaivskyi, Bruno Gayral, Julien Pernot, Georges Brémond, and Bruno Daudin
Nanoscale imaging of dopant incorporation in n-type and p-type GaN nanowires by scanning spreading resistance microscopy
Journal of Applied Physics 131, 075701 (2022)
DOI: https://doi.org/10.1063/5.0080713


W. J. Legerstee, M. Boekel, S. Boonstra, and E. M. Kelder
Scanning Probe Microscopy Facility for Operando Study of Redox Processes on Lithium ion Battery Electrodes
Frontiers in Chemistry 2021; 9: 505876
DOI: 10.3389/fchem.2021.505876
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8082686/


Markus Wohlfahrt, Michael J. Uren, Yidi Yin, Kean Boon Lee, and Martin Kuball
Vertical field inhomogeneity associated with threading dislocations in GaN high electron mobility transistor epitaxial stacks
Applied Physics Letters 119, 243502 (2021)
DOI: https://doi.org/10.1063/5.0066346
https://eprints.whiterose.ac.uk/183916/1/Vertical%20field%20inhomogeneity%20associated%20with%20threading%20dislocations%20in%20GaN%28accepted%29.pdf


Chang Won Park, Jung-Hun Lee, Jae Kwon Seo, Weerawat To A Ran, Dongmok Whang, Soo Min Hwang and Young-Jun Kim
Graphene/PVDF Composites for Ni-rich Oxide Cathodes toward High-Energy Density Li-ion Batteries
Materials 2021, 14(9), 2271
DOI: https://doi.org/10.3390/ma14092271


Oleksandr Synhaivskyi, David Albertini, Pierre Gaffuri, Jean-Michel Chauveau, Vincent Consonni, Brice Gautier, and Georges Bremond
Evidence of Piezoelectric Potential and Screening Effect in Single Highly Doped ZnO:Ga and ZnO:Al Nanowires by Advanced Scanning Probe Microscopy
Journal of Physical Chemistry C 2021, 125, 28, 15373–15383
DOI: https://doi.org/10.1021/acs.jpcc.1c00926
https://hal.univ-grenoble-alpes.fr/hal-03318851/document


Jingfeng Song, Shihao Zhuang, Michael Martin, Luis A. Ortiz-Flores, Binod Paudel, Dmitry Yarotski, Jiamian Hu, Aiping Chen, Bryan D. Huey
Interfacial-Strain-Controlled Ferroelectricity in Self-Assembled BiFeO3 Nanostructures
Advanced Functional Materials, Volume 31, Issue 34, August 20, 2021, 2102311
DOI: https://doi.org/10.1002/adfm.202102311


Mahdi Mohammadi Ghaleni, Shayan Kaviani, Kimya Rajwade, Mona Bavarian, François Perreault, Siamak Nejati
All Dry Bottom-Up Assembly of Omniphobic Interfaces
Advanced Materials Surfaces, Volume 7, Issue 12, June 23, 2020, 1902159
DOI: https://doi.org/10.1002/admi.201902159


C. ALBONETTI, S. CHIODINI, P. ANNIBALE, P. STOLIAR, R. V. MARTINEZ, R. GARCIA, F. BISCARINI
Quantitative phase-mode electrostatic force microscopy on silicon oxide nanostructures
Journal of Microscopy, Volume 280, Issue 3, Special Issue: Science through Scanning Probe Microscopy, Extended Version, Bologna 2019, December 2020, Pages 252-269
DOI: https://doi.org/10.1111/jmi.12938


Benjamin Meunier, Dolors Pla, Raquel Rodriguez-Lamas, Michel Boudard, Odette Chaix-Pluchery, Eugénie Martinez, Nicolas Chevalier, Carmen Jiménez, Mónica Burriel, and Olivier Renault
Microscopic Mechanisms of Local Interfacial Resistive Switching in LaMnO3+δ
ACS Applied Electronic Materials 2019, 1, 5, 675–683
DOI: https://doi.org/10.1021/acsaelm.9b00030
https://pubs.acs.org/doi/10.1021/acsaelm.9b00030


Artur Zielinski, Mateusz Cieslik, Michal Sobaszek, Robert Bodganowicz, Kazimierz Darowicki, Jacek Ryl
Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes
Ultramicroscopy, Volume 199, April 2019, Pages 34-45
DOI: https://doi.org/10.1016/j.ultramic.2019.01.004
https://arxiv.org/ftp/arxiv/papers/1811/1811.05709.pdf


James J. Steffes, Roger A. Ristau, Ramamoorthy Ramesh, and Bryan D. Huey
Thickness scaling of ferroelectricity in BiFeO3 by tomographic atomic force microscopy
PNAS 2019, 116 (7) 2413-2418
DOI: https://doi.org/10.1073/pnas.1806074116


Rami Khazaka, Yann Bogumilowicz, Denis Rouchon, Hervé Boutry, Zdenek Chalupa, Valérie Lapras, Bernard Prévitali, Nicolas Chevalier, Anne Marie Papon, Sylvain David, Sylvain Maitrejean
Confined selective lateral epitaxial growth of 16-nm thick Ge nanostructures on SOI substrates: Advantages and challenges
Applied Surface Science, Volume 445, 1 July 2018, Pages 77-80
DOI: https://doi.org/10.1016/j.apsusc.2018.03.104


Alexey Lipatov, Michael J. Loes, Haidong Lu, Jun Dai, Piotr Patoka, Nataliia S. Vorobeva, Dmitry S. Muratov, Georg Ulrich, Bernd Kästner, Arne Hoehl, Gerhard Ulm, Xiao Cheng Zeng, Eckart Rühl, Alexei Gruverman, Peter A. Dowben, and Alexander Sinitskii
Quasi-1D TiS3 Nanoribbons: Mechanical Exfoliation and Thickness-Dependent Raman Spectroscopy
ACS Nano 2018, 12, 12, 12713–12720
DOI: https://doi.org/10.1021/acsnano.8b07703
https://par.nsf.gov/servlets/purl/10096483


Ehsan Nasr Esfahani, Xiaoyan Liu, Jiangyu Li
Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis
Journal of Materiomics, Volume 3, Issue 4, December 2017, Pages 280-285
DOI: https://doi.org/10.1016/j.jmat.2017.07.001


Nico Kaiser, Stephan Bradler, Christoph König and Bernhard Roling
In Situ Investigation of Mixed Ionic and Electronic Transport across Dense Lithium Peroxide Films
Journal of The Electrochemical Society, Volume 164, Number 4, A744
DOI: https://doi.org/10.1149/2.1111704jes


Seungbum Hong, Sheng Tong, Woon Ik Park , Yoshiomi Hiranaga, Yasuo Cho, and Andreas Roelofs
Charge gradient microscopy
PNAS (2014), 111 (18) 6566-6569
DOI: https://doi.org/10.1073/pnas.1324178111


Alexander Ulyashin, Anna Sytchkova
Hydrogen related phenomena at the ITO/a-Si:H/Si heterojunction solar cell interfaces
PSS applications and materials science, Volume 210, Issue 4. Special Issue: Advanced Concepts for Silicon Based Photovoltaics, April 2013, Pages 711-716
DOI: https://doi.org/10.1002/pssa.201200459
https://www.sintef.no/globalassets/project/thinsi/pdf/pssa_2012004591.pdf


Julia Kruempelmann, Hendrik Reinhardt, Chihiro Yada, Fabio Rosciano, Norbert Hampp, Bernhard Roling
AFM tip-induced metal particle formation on laser-structured and on unstructured surfaces of solid-state ion conductors
Solid State Ionics, Volume 234, 7 March 2013, Pages 46-50
DOI: https://doi.org/10.1016/j.ssi.2013.01.003


C. J. Forman, N Wang, Z Y Yang, C G Mowat, S Jarvis, C Durkan and P D Barker
Probing the location of displayed cytochrome b562 on amyloid by scanning tunnelling microscopy
Nanotechnology, (2013) Volume 24, 175102
DOI: https://doi.org/10.1088/0957-4484/24/17/175102


Julia Kruempelmann, Dirk Dietzel, Andre Schirmeisen, Chihiro Yada, Fabio Rosciano, Bernhard Roling
Nanoscale electrochemical measurements on a lithium-ion conducting glass ceramic: In-situ monitoring of the lithium particle growth
Electrochemistry Communications, Volume 18, 2012, Pages 74-77
DOI: https://doi.org/10.1016/j.elecom.2012.02.019


Diego Gutiérrez, Michael Foerster, Ignasi Fina, Josep Fontcuberta, Daniel Fritsch, and Claude Ederer
Dielectric response of epitaxially strained CoFe2O4 spinel thin films
Physical Review B, (2012) 86, 125309
DOI: https://doi.org/10.1103/PhysRevB.86.125309
https://www.researchgate.net/profile/I-Fina/publication/266022597_Dielectric_response_of_epitaxially_strained_CoFe_2_O_4_spinel_thin_films/links/551a90760cf26cbb81a2f241/Dielectric-response-of-epitaxially-strained-CoFe-2-O-4-spinel-thin-films.pdf


H. Lu, D. J. Kim, C.-W. Bark, S. Ryu, C. B. Eom, E. Y. Tsymbal, and A. Gruverman
Mechanically-Induced Resistive Switching in Ferroelectric Tunnel Junctions
Nano Letters 2012, 12, 12, 6289–6292
DOI: https://doi.org/10.1021/nl303396n


Shojiro Miyake and Mei Wang
Nano- and Macrotribological Properties of Nanoperiod Multilayer Films Deposited by Bias Sputtering
Journal of Nanotechnology, Volume 2012 |Article ID 561250
DOI: https://doi.org/10.1155/2012/561250


Tewfik Souier  and Matteo Chiesa
Effect of surface conditions and strain hardening on the passivity breakdown of 304 stainless steel
Journal of Materials Research , Volume 27 , Issue 12 , 28 June 2012 , pp. 1580 – 1588
DOI: https://doi.org/10.1557/jmr.2012.5