PPP-CONTAuD

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

      The probe offers unique features:

      - guaranteed tip radius of curvature < 10 nm
      - highly doped to dissipate static charge
      - Au coating on detector side of cantilever
      - chemically inert

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

  

Cantilever data:

Technical Data	Nominal Value	Specified Range
Thickness /µm	2	1.0 - 3.0
Mean Width /µm	50	42.5 - 57.5
Length /µm	450	440 - 460
Force Constant /(N/m)	0.2	0.02 - 0.77
Resonance Frequency /kHz	13	6 - 21

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Coating
PPP-CONT-10	10	of all probes	Au (detector side)

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com