PPP-CONTSC
PointProbe® Plus Contact Mode Short Cantilever
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
- The probe offers unique features:
- - guaranteed tip radius of curvature < 10 nm
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity
- alignment grooves on backside of silicon holder chip
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
| Technical Data | Nominal Value | Specified Range |
|---|---|---|
| Thickness /µm | 1 | 0.1 - 2.0 |
| Mean Width /µm | 48 | 40 - 55 |
| Length /µm | 225 | 215 - 235 |
| Force Constant /(N/m) | 0.2 | 0.01 - 1.87 |
| Resonance Frequency /kHz | 23 | 1 - 57 |
| Order Code | Quantity | Data Sheet | Coating |
|---|---|---|---|
| PPP-CONTSC-10 | 10 | of all probes | without |
| PPP-CONTSC-20 | 20 | of all probes | without |
| PPP-CONTSC-50 | 50 | without | without |
| PPP-CONTSC-W | > 380 | of up to 32 probes | without |
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com