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uniqprobe™ AFM Tips

• Small variations of AFM cantilever force constant and resonance frequency 
• AFM cantilevers made from stress free material leading to absolutely straight AFM cantilevers 
• Typical AFM tip radius of curvature better than 10nm
• Reduced drift for SPM and AFM applications in liquid environments
• Chemically inert
• High mechanical Q-factor for high sensitivity

Platinum Silicide AFM Tips

• Platinum silicide AFM probe with excellent conductivity and good wear-out behavior
• Typical AFM tip radius 25 nm
• Alignment grooves on backside of silicon holder chip

AdvancedTEC™ AFM Tips

• Monolithic silicon AFM probes for very high resolution imaging
• Fits to all well known AFMs
• Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
• Rectangular AFM cantilever with trapezoidal cross section
• Holder dimensions are 1.6 mm x 3.4 mm
• REAL AFM TIP VISIBILITY FROM TOP
• AFM tip height 15-20 µm
• Typical AFM tip radius of curvature < 10 nm
• Aspect Ratio of the last 1.5 µm of the AFM tip > 4:1 (from front and side)
• AFM tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
• Also available with gold or platinum iridium coating

PointProbe® Plus AFM Tips

• Monolithic silicon AFM probes for very high resolution imaging
• Fits to all well-known AFMs
• Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
• Rectangular AFM cantilever with trapezoidal cross section
• Holder dimensions are 1.6 mm x 3.4 mm
• AFM tip radius typically better than 7 nm
• Improved consistency and resolution
• Minimized variation in AFM tip shape

PointProbe® Plus XY-Alignment AFM Tips

• When used together with the Alignment Chip, AFM probes of three different AFM cantilever lengths (e.g. PPP-NCHR; PPP-XYCONTR and PPP-FMR) can be exchanged without readjustment of the beam deflection laser
• Monolithic silicon AFM probes for very high resolution imaging
• Fits to all well-known AFMs
• Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
• Rectangular AFM cantilever with trapezoidal cross section
• AFM tip radius typically better than 7 nm
• Improved consistency and resolution
• Minimized variation in AFM tip shape

SuperSharpSilicon™ AFM Tips

• AFM probes for enhances resolution of micro roughness and nanostructures
• AFM tip radius is typically better than 2 nm

High Aspect Ratio AFM Tips

• The length of the high aspect portion of the AFM tip is larger than 1.5 µm or 2 µm respectively
• Special AFM tips are available to compensate the tilt of the scanner-head
• The AFM tip radii are typically better than 10 nm. We guarantee at least 15 nm
• The overall AFM tip height is 10 to 15 µm allowing measurements on highly corrugated samples
• The whole AFM tip as well as the rest of the sensor is fabricated out of one single crystal silicon (monolithic design) resulting in a high lateral stiffness and rigidity

Rotated AFM Tips

• General data like PointProbe® Plus
• AFM tip is rotated 180° with respect to the center axis along the AFM cantilever

Tipless AFM Cantilevers

• no AFM tip
• highly doped to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

Plateau AFM Tips

• Moved to the NANOSENSORS™ Special Developments List

Gold Coated AFM Tips

• 70 nm thick gold coating on detector side of the AFM cantilever
• 70 nm thick gold coating on both sides of the AFM cantilever
• Metallic conductivity of the AFM tip
• Detector side coating enhances the reflectivity of the laser beam

Diamond Coated AFM Tips

• 100 nm thick coating of polycrystalline diamond on the tip side
• 200 nm thick coating of polycrystalline diamond on the tip side
• Unsurpassed hardness of the AFM tip

Platinum-Iridium Coated AFM Tips

• 25 nm thick layer of chromium and platinum iridium
• Coating on both sides of the AFM cantilever
• Allows electrical measurements
• Detector side coating enhances the reflectivity of the laser beam by a factor of 2
• Stress compensated and wear resistant

Magnetic Coated AFM Tips

• Hard magnetic coating on the tip side (coercivity between 0.75 and 300 Oe, remanence magnetization between 80 and 300 emu/cm³)
• Effective magnetic moment between 2.5 and 13 emu
• Metallic electrical conductivity
• Lowest possible guaranteed tip radius of curvature down to < 15 nm
• Highest possible magnetic resolution better than 25 nm
• Al coating on detector side of AFM cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5

Self-sensing + Self-actuating AFM Probes

Special Developments List

Examples of our Special Developments are:

• Plateau tips with a customized diameter
• Rounded AFM tips
• Sphere AFM tips
• Platinium Iridium or Gold coating with different thicknesses on various AFM probe types
• Backside Gold and tipside Nitride coating

Gratings

In close cooperation with national technical authorities for metrology in Europe, NANOSENSORS™ has developed a set of calibration gratings for SPM applications. These gratings allow the calibration of the X,Y and Z axis of an SPM machine. In addition certain system induced limitations of such apparatus can be revealed and compensated.

• 2D200 - Lateral-(xy)-Calibration Grating moved to NANOSENSORS™ Special Developments List
• 2D300 - Lateral-(xy)-Calibration Grating moved to NANOSENSORS™ Special Developments List