SSS-NCL

Cantilever data:

Property	Nominal Value	Specified Range
Resonance Frequency [kHz]	190	146 - 236
Force Constant [N/m]	48	21 - 98
Length [µm]	225	215 - 235
Mean Width [µm]	38	30 - 45
Thickness [µm]	7	6 - 8

Order codes and shipping units:

Order Code	AFM probes per pack	Data sheet
SSS-NCL-10	10	of all probes
SSS-NCL-20	20	of all probes
SSS-NCL-50	50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

SuperSharpSilicon AFM tip closeup

NANOSENSORS™ SuperSharpSilicon

SuperSharpSilicon™ - Non-Contact / Tapping Mode - Long Cantilever

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

guaranteed AFM tip radius of curvature < 5 nm
typical AFM tip radius of curvature of 2 nm
typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
half cone angle at 200 nm from apex < 10°
monolithic material
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity
alignment grooves on backside of silicon holder chip
precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

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