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August 2012

NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.