December 2018

Season’s Greetings from NANOSENSORS AFM probes

by NANOSENSORS
20 December 201820 November 2022
News & Events

With this Seasonal Special Development PointProbe Plus AFM tip with pine, snow and star coating we would like to wish all users of our AFM…

by NANOSENSORS
17 December 201820 November 2022
Science & Technology

Figure 1 from “Optical control of polarization in ferroelectric heterostructures”: Electrically induced polarization switching in the MoS2/BaTiO3/SrRuO3 junction. a, b PFM phase (a) and amplitude (b) images after application of a negative voltage pulse (−5 V, 0.5 s) to the MoS2 flake. The 12-u.c.-thick BTO film underneath the MoS2 flake is fully switched to the upward polarization, Pup. c, d PFM phase (c) and amplitude (d) images after application of several positive voltage pulses (+5 V, 0.5 s) to the MoS2 flake. BTO underneath the MoS2 flake is fully switched to downward polarization, Pdown. The polarization state of the bare BTO film (at the lower right corner) is not affected by the electrical bias. e, f The I–V characteristics of the same junction measured in the dark and during illumination. The tunneling current for the OFF state (Pup) is largely increased under illumination. Silicon AFM probes with Pt/Ir conductive coating and nominal stiffness of 3 N m−1 (PPP-EFM, NANOSENSORS) were used to perform the KPFM and PFM measurements.

“In the ferroelectric devices, polarization control is usually accomplished by application of an electric field.”* In the article “Optical control of polarization in ferroelectric heterostructures”…

by NANOSENSORS
4 December 201820 November 2022
Science & Technology

Figure 1 from "Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy": Schematic of the experimental setup, NANOSENSORS PPP-NCST-Pt AFM probes were used

In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano…