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NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

视频介绍 – PointProbePlus原子力显微镜探针 – NANOSENSORS™ –

视频介绍 – PointProbePlus原子力显微镜探针 – NANOSENSORS™ – 在 Youtube: 和在  Youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html?from=y1.7-1.2 NANOSENSORS的Pointprobes是第一个商业化量产的硅原子力显微镜探针。从1991年进入市场开始,他们就成为了这一领域的标杆。 PointProbePlus探针在非接触模式和轻敲模式的应用中取得了巨大的成功,并且在此基础上发展出一系列更高端的AFM探针。 PointprobePlus是Pointprobe的增强版,它有着更为一致的针尖形状从而保证了更为可靠的成像结果。 而且针尖的尖端性能进一步提升,其半锥角达到了10度,而尖端半径小于7nm。 基于PointProbePlus针尖,我们提供一些特别定制的AFM探针 。 SuperSharpSilicon探针是在PointProbePlus探针的基础上,通过尖端锐化技术,使其针尖的曲率半径小于2nm。 该探针在特征尺度为几十纳米的样品表面,可以实现最高的分辨率。 High Aspect Ratio tips 高长径比探针是在PointProbePlus的基础上,通过聚焦离子束研磨,在针尖的尖端1到两微米形成超小的锥角。 它们是专为半导体应用中,沟槽或通孔的表征而设计的。… Read More »视频介绍 – PointProbePlus原子力显微镜探针 – NANOSENSORS™ –

Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes

SEM image of an uniqprobe cantilever.
SEM image of an uniqprobe cantilever.

SEM image of an uniqprobe cantilever.

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

Read More »NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes

NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List

NANOSENSORS™ Nanoink® compatible Silicon Nitride Arrays
NANOSENSORS™ Nanoink® compatible Silicon Nitride Arrays

NANOSENSORS™ Nanoink® compatible
Silicon Nitride Arrays

NANOSENSORS™ develops many AFM tip varieties that are not commercialized as standard products but still are available on demand. We call these customized products “Special Developments”.

Among these Special Developments are also some Silicon Nitride AFM Probe Arrays that among other applications can also be used as DPN pens and are therefore compatible with some NanoInk® instruments.

Read More »NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List

NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

Read More »NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series