NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Did you know that NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and investigating sample surfaces with… Read More »NANOSENSORS AFM probes for Magnetic Force Microscopy
Lately the production of nanocrystalline magnetic materials starting with coarse grained materials (top-down approach) has received increasing interest.* The advantage of the top-down approach compared… Read More »On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion
NANOSENSORS™ has completed the development of two additional Membrane-type Surface-stress Sensors (MSS) ( SD-MSS-1KPMAl and SD-MSS-1KPMAu ) dedicated for torque magnetometry. Torque magnetometry is a… Read More »Two New MSS Sensors for Torque Magnetometry added to Special Developments List
Muscle wasting is connected with changes in various cellular mechanisms that influence protein homeostasis, transcription, protein acetylation and different metabolic pathways. * Scientific studies have… Read More »Cytoskeletal disorganization underlies PABPN1-mediated myogenic disability
A NANOSENSORS™ self-sensing self-activating Akiyama probe was used in a home-built Scanning Probe Microscope for this interesting research article. *Florian Lauraux, Sarah Yehya, Stéphane Labat,… Read More »In‐situ force measurement during nano‐indentation combined with Laue microdiffraction
The reindeer are back in the park! This is a sure sign that it is again time to wish all users of our AFM probes… Read More »Season’s Greetings from NANOSENSORS AFM probes
