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NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

The screencast on the soft, drift-reduced NANOSENSORS™ uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 1000… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates

Figure 5. from “Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates “ by Lukas Kinner et al.:

In the article “Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates “ Lukas Kinner, Emil J W List-Kratochvil and Theodoros… Read More »Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences : Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot

Correlating data from different microscopy techniques holds the potential to discover new facets of signalling events in cellular biology.* In the article “Simultaneous co-localized super-resolution… Read More »Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences