NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation… Read More »Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures
We are at booth 218 at the ChinaNano 2019, the 8th International Conference on Nanoscience and Technology at the Beijing International Convention Center (BICC). We… Read More »Meet NANOSENSORS at booth 218 at ChinaNano 2019 Beijing August 17 – 19, 2019
NANOSENSORS™ is a proud sponsor of the 2019 Asia-Pacific Workshop on Piezoresponse Force Microscopy ( PFM) and Nanoscale Electromechanics of Functional Materials and Electrochemical Systems… Read More »NANOSENSORS proudly sponsors Asia-Pacific PFM 2019 workshop
Fluid-induced alteration of rocks and mineral-based materials often starts at confined mineral interfaces where nm-thick water films can persist even at high overburden pressures and… Read More »Nucleation in confinement generates long-range repulsion between rough calcite surfaces
Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PPP-NCL was used for this image)
In the recent publication “Ferroelectricity-free lead halide perovskites” Andrés Gómez, Qiong Wang, Alejandro R. Goñi, Mariano Campoy-Quilesa and Antonio Abate describe how they employed direct… Read More »Ferroelectricity-free lead halide perovskites
The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 1000 views mark. Accurately determined cantilever properties are very important for… Read More »Calibration Service for AFM Cantilevers