Skip to content

NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

Figure 1 from "Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy": Schematic of the experimental setup, NANOSENSORS PPP-NCST-Pt AFM probes were used

In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes

Figure 12 from: A. Krivcov et. al, Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution: Figure 12. (a) topography of copper substrate with single magnetite nanoparticle; (b) phase image in 11 nm lift height with an attraction at the place of the nanoparticle; (c) Cross section of a single magnetite nanoparticle (dotted line in (a)) with 10 nm diameter taken on copper substrate with NANOSENSORS SSS-MFMR AFM probe

In their publication “Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution” Alexander Krivcov, Tanja Junkers and Hildegard Möbius describe… Read More »Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes