NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
NANOSENSORSTM has completed the development of a new Membrane-type Surface-stress Sensor (MSS) dedicated for torque magnetometry. Torque magnetometry is a useful technique often employed for… Read More »New MSS Sensor for Torque Magnetometry added to the Special Development List
It is the last day if the International Scanning Probe Microscopy (ISPM) 2018 conference in Tempe, Arizona. Don’t forget to pass by the NanoAndMore USA… Read More »Learn more about our new AFM probes at ISPM 2018
Dr. Oliver Krause’s screencast on the history of NANOSENSORS AFM probes has just passed the 1000 views mark. Congratulations Oliver! This screencast is is also… Read More »History of NANOSENSORS AFM Probes Video has passed 1000 Views Mark
See you at Arablab 2018 from March 18-21, 2018 at Dubai International Exhibition Center. #Arablab #Arablab2018 #AtomicForceMicroscopy
In a recent blogpost we shared the news that NANOSENSORSTM Membrane-type Surface-stress Sensors (MSS) could successfully be used for torque magnetometry . We have therefore… Read More »R&D News: New MSS Sensor Dedicated for Torque Magnetometry under Development
Winter returned just in time to celebrate the new lunar year of the dog in the snow. Happy New Lunar Year!
