NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Don’t forget to visit NANOSENSORS at booth 7-H at the MEMS Sensing & Network Systems 2017 conference and exhibition in Makuhari/Japan this week to learn… Read More »Learn more about NANOSENSORS MSS (Membrane Type Surface Stress Sensors) at MEMS SENSING & NETWORK SYSTEM 2017
NANOSENSORS proudly sponsors the 20th International Conference on Non-Contact Atomic Force Microscopy taking place in Suzhou, P.R. China from September 25th to September 29th, 2017.… Read More »NANOSENSORS proudly sponsors Non-Contact AFM Conference
We are on booth 503 at the China Nano 2017, Beijing. Looking forward to see you!
NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the… Read More »Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
In this article the authors present a new method for torque magnetometry by using a commercially available membrane-type surface stress sensor (MSS) – the NANOSENSORS… Read More »New Method for Torque Magnetometry Using a Commercially Available Membrane-Type Surface Stress Sensor
アドバンスドテックシリーズはシャープな三角錐の探針がカンチレバー先端より更に前方へと突き出ているのが特長。 探針を確実に測定領域にポジショニングしたい場合や、探針先端を直接見ながら作業するナノマニピュレーションなどのアプリケーションに最適です。 Screencasts on the NANOSENSORS AdvancedTEC tip view AFM probes are also available in English:
