Happy Swiss National Holiday with Smallest Swiss Cross
Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PPP-NCL was used for this image)
NANOSENSORS
NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
Calibration Service for AFM Cantilevers
The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 500 views mark Accurately determined cantilever properties are very important for… Read More »Calibration Service for AFM Cantilevers
Hall effect in charged conducting ferroelectric domain walls
In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls
Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
