NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
The year starts well! Full house at the nano tech 2017, the international Nanotechnology conference and exhipition held at Big Sight Tokyo (Feb 15-17, 2017).… Read More »Nanotechnology conference in Japan – Welcome at nano tech 2017
Are you looking for extra tall tips for nanoprofiling and other applications in this direction? Then look no further. There is a PointProbe Plus version… Read More »PointProbe Plus XL – Extra Tall Tips for Nanoprofiling
Seasonal Special Development: PointProbe Plus AFM tip with pine, snow and star coating. Happy Holidays to you all!
Webinar: Celebrating 30 years of AFM and STMThursday 17 November 2016, 5.00 p.m. UK time Join IOP Science for their latest webinar as they celebrate… Read More »Webinar: 30 years of AFM and STM
We are attending the IUMRS-CA2016 conference in Qingdao this week. Let us know if you would like to meet us there.
