World Science Day
Single pass Kelvin Force Microscopy
Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)
NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)
For the full brochure please follow this link: http://www.nanosensors.com/pdf/AdvancedTEC.pdf
High resolution imaging of the cytoplasmic side of bacteriorhodospin (BR) (left) and overlay of 6 force-distance curves (right) showing the controlled C-terminal unfolding of a single BR membrane protein from its native environment.
The measurements were recorded in buffer solution with a FlexAFM V3 (Nanosurf) using a NANOSENSORS™ uniqprobe qp-CONT cantilever by Dr. Patrick Frederix from Nanosurf AG.
Read More »Single molecule force spectroscopy with NANOSENSORS™ uniqprobe qp-CONT
Check out the excellent work by Javier Aguilera and his coauthors. The authors used NANOSENSORS™ Super Sharp Silicon AFM tips to demonstrate awesome morphological features of AAV-2 and complexes with different heparin oligosaccharides and investigated the effect of glycosaminoglycans (GAGs) on the aggregation of serum amyloid A (SAA).
In a new application note Ilya V. Popolov and Miklós Mohos from the University of Bern and Christoph Richter from NANOSENSORS show how insulated conductive probes can best be used for combined AFM and electrochemical studies.
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.
Read More »Product screencast NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes
Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
Read More »Product Screencast NANOSENSORS™ High Aspect Ratio Silicon AFM probes