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NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

World Science Day

Single pass Kelvin Force Microscopy

Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)

KPFM_01

Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.

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Single molecule force spectroscopy with NANOSENSORS™ uniqprobe qp-CONT

High resolution imaging of the cytoplasmic side of bacteriorhodospin (BR) (left) and overlay of 6 force-distance curves (right) showing the controlled C-terminal unfolding of a single BR membrane protein from its native environment.

BR image & spectroscopy

The measurements were recorded in buffer solution with a FlexAFM V3 (Nanosurf) using a NANOSENSORS™ uniqprobe qp-CONT cantilever by Dr. Patrick Frederix from Nanosurf AG.

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