NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
In a new application note Ilya V. Popolov and Miklós Mohos from the University of Bern and Christoph Richter from NANOSENSORS show how insulated conductive probes can best be used for combined AFM and electrochemical studies.
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.
Read More »Product screencast NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes
Product Screencast on the NANOSENSORS™ High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.
Read More »Product Screencast NANOSENSORS™ High Aspect Ratio Silicon AFM probes
Product Screencast on the NANOSENSORS™ Magnetic Force Microscopy Silicon MFM Probes held by head of R&D Thomas Sulzbach.
Read More »Product Screencast NANOSENSORS™ Magnetic Force Microscopy probes
Product Screencast on the NANOSENSORS™ AdvancedTEC™ – Advanced Tip at the End of the Cantilever – High Resolution Silicon AFM Probes held by product developer Dr. Oliver Krause.
Read More »Product screencast NANOSENSORS™ AdvancedTEC™ AFM probes
Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
Product Screencast on the NANOSENSORS™ PointProbe® Plus silicon AFM probe held by Thomas Sulzbach, head of R&D.