NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
Product Screencast on the NANOSENSORS™ Magnetic Force Microscopy Silicon MFM Probes held by head of R&D Thomas Sulzbach.
Read More »Product Screencast NANOSENSORS™ Magnetic Force Microscopy probes
Product Screencast on the NANOSENSORS™ AdvancedTEC™ – Advanced Tip at the End of the Cantilever – High Resolution Silicon AFM Probes held by product developer Dr. Oliver Krause.
Read More »Product screencast NANOSENSORS™ AdvancedTEC™ AFM probes
Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
Product Screencast on the NANOSENSORS™ PointProbe® Plus silicon AFM probe held by Thomas Sulzbach, head of R&D.
Product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ given by Dr. Oliver Krause. NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required.
Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes
Product screencast on the Akiyama Probe (A-Probe) from NANOSENSORS™ given by Dr. Terunobu Akiyama with an introduction in this novel self-sensing and self-actuating (-exciting) probe for dynamic mode atomic force microscopy (AFM).
Read More »Product screencast NANOSENSORS™ Akiyama-Probe (A-Probe)
Product Screencast on the NANOSENSORS™ uniqprobe AFM Probes series by product developer Dr. Laure Aeschimann.
Read More »Product screencast NANOSENSORS™ uniqprobe AFM Probes series