NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
SEM image of an uniqprobe cantilever.
The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.
Read More »NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes
NANOSENSORS™ Nanoink® compatible
Silicon Nitride Arrays
NANOSENSORS™ develops many AFM tip varieties that are not commercialized as standard products but still are available on demand. We call these customized products “Special Developments”.
Among these Special Developments are also some Silicon Nitride AFM Probe Arrays that among other applications can also be used as DPN pens and are therefore compatible with some NanoInk® instruments.
NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series
NANOSENSORS™ not only uses its know-how to manufacture its well-known standard products. The experts at NANOSENSORS™ also develop many tip versions and other developments that are not commercialized as standard products but are available on demand. We call these customized products “Special Developments”.
The Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.
Read More »NANOSENSORS™ introduces self-sensing self-actuating Akiyama-Probe
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
Read More »NANOSENSORS™launches new Silicon Plateau Tip Series
The invention of the Alignment Chip by NANOSENSORS™ more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.