30 years ago, on March 3rd 1986, Gerd Binnig, Carl Quate and Christoph Gerber published a paper simply titled Atomic Force Microscope. Happy Birthday! Reprinted… Read More »Happy Birthday Atomic Force Microscope!
In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe® BioT to scan in ScanAsyst® mode in air. We imaged crystallites with… Read More »High quality AFM tips for the use in ScanAsyst® mode: NANOSENSORS™ uniqprobe® BioT
Zeno Schumacher, Yoichi Miyahara and Peter Grütter from McGill University, Montreal together with our colleague Laure Aeschimann from NANOSENSORS™ are showing in their current publication… Read More »Partial Coatings of AFM Cantilevers II
Zeno Schumacher, Yoichi Miyahara and Peter Grütter from McGill University, Montreal together with our colleague Laure Aeschimann from NANOSENSORS™ are showing in their current publication… Read More »Partial Coatings of AFM Cantilevers I
Often it is necessary to add a coating to an AFM cantilever. In most cases it is a reflex coating on the backside of the… Read More »NANOSENSORS™ Uniqprobes®: Partially Coated Cantilever for Advances in Life Science AFM
Standard SiN AFM probes may have a lot of advantages for using them in your liquid cell measurements. But they also have their limits when… Read More »Spike up a Silicon Nitride AFM tip for high topography biology and life science imaging
NANOSENSORS has added a new type of rounded AFM tips to the Special Development List. The new rounded AFM tips SD-R30 have a typical tip… Read More »Rounded AFM Tips for Nanomechanics and Force Spectroscopy – Special Development List updated