Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication.

Figure 1: OTFT structure and setup for force microscopy on bent substrates. From: T. Cramer et. al., Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy. Sci. Rep. 6, 38203; doi: 10.1038/srep38203 (2016).

For the full article have a look at:
https://www.nature.com/articles/srep38203

The article “Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy”  by Tobias Cramer et. al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/