Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory got impressive Scanning Electrochemical AFM measurement results captured with EC-AFM probes developed and manufactured by our colleague Christoph Richter.
http://pubs.acs.org/doi/abs/10.1021/ac500946v
Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf
Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”, Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.