NANOSENSORS™ has launched a new series of silicon Plateau Tips today.
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
Plateau tips are used in various special applications in Material Science, Life Science, Biology and Pharmaceutics.
Reflecting the many different kinds of possible applications the plateau tips are available on various cantilever geometries covering force constants ranging from 0.2 N/m to 48 N/m and resonance frequencies from 13 kHz to 330 kHz. The diameter of the plateau face can be adjusted between 1.8 µm /standard type) and 10 µm (customized type).
Customized larger plateau diameters and other plateau shapes are available upon request.
Please follow these links for more detailed information:
NANOSENSORS™ Plateau Tip Series – Product Flyer
Datasheets: