Blog – NANOSENSORS™ – R&D Leaders in AFM Probes Since 1990 – Page 23 – Check out our blog for the latest news and developments in nano technology.

See you at AVS in Long Beach CA today

by NANOSENSORS
25 October 201815 March 2023
News & Events

Manfred Detterbeck at AVS 65th International Symposium and Exhibition.

Meet our CEO this week at AVS 65th International Symposium and Exhibition in Long Beach CA.

Learn more about NANOSENSORS MSS (Membrane Type Surface Stress Sensors) at MEMS SENSING & NETWORK SYSTEM 2018

by NANOSENSORS
17 October 201815 March 2023
News & Events

NANOSENSORS at the booth of the MSS alliance

Don’t forget to visit NANOSENSORS™ at booth 14-H at the MEMS Sensing & Network Systems 2018 conference and exhibition in Makuhari/Japan this week to learn… Read More »Learn more about NANOSENSORS MSS (Membrane Type Surface Stress Sensors) at MEMS SENSING & NETWORK SYSTEM 2018

Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure

by NANOSENSORS
15 October 201815 March 2023
Science & Technology

Figure 6 from Mir & Ochiai "Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure* a) Topography SPM image, and b)I-V curves of the polymer-Ag honeycomb film on HOPG (preparation conditions for polymer-Ag honeycomb film: poly(NVK-co-MAH)-g-PMMA from PMMA (Mn=2100), 0.3 mg mL−1 and 50μL; measurement conditions: topography SPM image was taken by contact mode using microfabricated PtSi- coated cantilever (f0: 15 kHz, C: 0.2 N m−1), and the I-V curves were taken at specific points. NANOSENSORS PtSi-CONT AFM probes were used for the Current-sensing scanning probe microscopy (CSSPM) images

“Fast growth in Internet of Things (IoT) has attracted a lot of attention of flexible and easily processable hybrid organic-inorganic nanomaterials, integrated into modern electronics… Read More »Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure

Resonant torsion magnetometry in anisotropic quantum materials

by NANOSENSORS
1 October 201815 March 2023
Science & Technology

Figure 1 from "Resonant torsion magnetometry in anisotropic quantum materials": Schematic overview of resonant torsion magnetometry. a First and second derivatives of the free energy with respect to the magnetic field B and the field orientation θ. b The quartz tuning fork of the Akiyama A-probe (http://www.akiyamaprobe.com) is electrically excited at the lowest-resonance mode of the silicon cantilever, producing a large out-of-plane motion at the tip of the cantilever. c Schematic representing the principle of measuring the magnetotropic coefficient k. In a magnetic field, the magnetic torque brings the lever to a new equilibrium position. The magnetic energy of the samples changes the effective stiffness of the lever, leading to a shift in the resonant frequency. d The silicon cantilever glued to each leg of the quartz tuning fork with a single crystal of RuCl3 mounted at the tip with Bayer silicone grease

Who said that AFM probes can only be used for Atomic Force Microscopy? In the article “Resonant torsion magnetometry in anisotropic quantum materials” which just… Read More »Resonant torsion magnetometry in anisotropic quantum materials

MAC Mode Cantilevers for Keysight, Agilent and Molecular Imaging AFMs now available from NANOSENSORS

by NANOSENSORS
17 September 201815 March 2023
News & Events

MAC mode imaging of lambda phage DNA in a buffer solution. Image courtesy of Keysight Technologies

Do you have a Keysight, Agilent or Molecular Imaging Atomic Force Microscope in your lab? Are you using MAC Mode (Keysight Technologies’ patented magnetic AC… Read More »MAC Mode Cantilevers for Keysight, Agilent and Molecular Imaging AFMs now available from NANOSENSORS

Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films

by NANOSENSORS
30 August 201815 March 2023
Science & Technology

Figure 1 from Borderon et al. Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films: Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 μm×1 μm for the c-domain ample and 1 μm × 0.5 μm for the a/c-domain sample. PFM characterization done with ATEC-EFM AFM probe

A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain… Read More »Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films

Zn2+-triggered self-assembly of Gonadorelin [6-D-Phe] to produce nanostructures and fibrils

by NANOSENSORS
15 August 201815 March 2023
Science & Technology

Figure 5 from Yordanova et. al. "Zn2+-triggered self-assembly of Gonadorelin [6-D-Phe] to produce nanostructures and fibrils" - AFM image of the Zn2+: GnRH [6-D-Phe] 10:1 complex. (a,b) Oligomers after preparation with tapping mode in Tris buffer solution (c,d) fibrils with tapping mode in air (z-scale indicates the average size of the formed oligomers and fibrils). NANOSENSORS qp-BioAC AFM probe was used to perform images in buffer solution

For this article the AFM images taken with tapping mode in Tris buffer solution were performed with the NANOSENSORS qp-BioAC (cantilever 3, resonance frequency 30kHz).… Read More »Zn2+-triggered self-assembly of Gonadorelin [6-D-Phe] to produce nanostructures and fibrils