NANOSENSORS PointProbePlusプローブ
走査型プローブ顕微鏡(SPM)および原子間力顕微鏡(AFM)に使われるプローブ/カンチ レバーには選択に困るほど数多くの種類があります。だからこそ、まずはこれをお使 いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」 に求められる高品質と高精度を備え幅広いアプリケーションにご利用頂けます。 https://youtu.be/4eiL8lpQ3fE
See you at the Arablab in Dubai next week
See you at the Sigma Enterprises booth at the Arablab in Dubai March 20 – 23, 2016, hall S-3, stall no. 905 #ARABLAB
Happy Birthday Atomic Force Microscope!
30 years ago, on March 3rd 1986, Gerd Binnig, Carl Quate and Christoph Gerber published a paper simply titled Atomic Force Microscope. Happy Birthday! Reprinted… Read More »Happy Birthday Atomic Force Microscope!
High quality AFM tips for the use in ScanAsyst® mode: NANOSENSORS™ uniqprobe® BioT
In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe® BioT to scan in ScanAsyst® mode in air. We imaged crystallites with… Read More »High quality AFM tips for the use in ScanAsyst® mode: NANOSENSORS™ uniqprobe® BioT
NANOSENSORS 磁力显微镜探针 MFM
The screencast on NANOSENSORS AFM probes for Magnetic Force Microscopy (MFM) is now available in Chinese on youtube and youku NANOSENSORS 磁力显微镜探针 MFM 在 Youtube… Read More »NANOSENSORS 磁力显微镜探针 MFM
NANOSENSORS at MRS Fall 2016
Have you seen the NANOSENSORS corner at the NanoAndMore booth 610 at MRS Fall 2016 already? Don’t forget to visit.