New NANOSENSORS blog
This is the official corporate blog of NANOSENSORS, manufacturer of high quality AFM tips and AFM probes for the Atomic Force Microscope. Here we publish news and… Read More »New NANOSENSORS blog
Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available
NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available
NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes
SEM image of an uniqprobe cantilever.
The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.
Read More »NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes
NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List
NANOSENSORS™ Nanoink® compatible
Silicon Nitride Arrays
NANOSENSORS™ develops many AFM tip varieties that are not commercialized as standard products but still are available on demand. We call these customized products “Special Developments”.
Among these Special Developments are also some Silicon Nitride AFM Probe Arrays that among other applications can also be used as DPN pens and are therefore compatible with some NanoInk® instruments.
NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series
NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series
NANOSENSORS™ presents Special Development List
NANOSENSORS™ not only uses its know-how to manufacture its well-known standard products. The experts at NANOSENSORS™ also develop many tip versions and other developments that are not commercialized as standard products but are available on demand. We call these customized products “Special Developments”.
NANOSENSORS™ introduces self-sensing self-actuating Akiyama-Probe
NANOSENSORS™ today announced the introduction of the Akiyama-probe
The Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.
Read More »NANOSENSORS™ introduces self-sensing self-actuating Akiyama-Probe