Product Screencast on the NANOSENSORS™ AdvancedTEC™ – Advanced Tip at the End of the Cantilever – High Resolution Silicon AFM Probes held by product developer Dr. Oliver Krause.
NANOSENSORS™ AdvancedTEC™ probes are designed for high resolution imaging. They feature a tetrahedral tip that protrudes over the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even if the probe is tilted as a result of its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (eg. nanomanipulation).
Thanks to their very small half cone angles the tip of the AdvancedTEC™ series shows great performance on samples that have a small pattern size combined with steep sample features.
Beside the standard version the AdvancedTEC™ is optionally available either with a double sided gold or double sided platinum-iridium5 alloy