Product Screencast on the NANOSENSORS™ PointProbe® Plus silicon AFM probe held by Thomas Sulzbach, head of R&D.
The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
PointProbe® Plus SPM probes are manufactured from highly doped, single crystal silicon without any intrinsic mechanical stress. Its low resistivity of 0.01 – 0.025 Ωcm avoids electrostatic charging of the probe. The monolitic design of tip, cantilever and support chip leads to an absolutely straight cantilever without any bending. The chemical inertness allows application in fluids or electrochemical cells. The tip is pointing into the 100-crystal direction.
More than 15 years of experience in producing high quality SPM probes resulted in this state of the art product. A continuously improved and refined manufacturing process and many quality control steps during the production ensure a stable and reliable fabrication that yields a top notch-product with the consistent quality NANOSENSORS™ users have come to expect over the years.