Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes are designed for measurements with enhanced resolution of nanostructures and microroughnesses. They are realised by an unique tip manufacturing process leading to a further improvement of the tip sharpness with radii typically as low as 2 nm.
The SuperSharpSilicon™ AFM Probes are fabricated on the base of the NANOSENSORS™ advanced PointProbe® Plus tip manufacturing process. Thus the geometry of holder and cantilever equals that of the PointProbe® Silicon-SPM-probes.
Nanosensors SuperSharpSilicon™ AFM Probes are available on different cantilever types for non-contact, acoustic or tapping mode applications as well as for force modulation techniques.