AdvancedTEC™

Energy dissipation on magic angle twisted bilayer graphene

by NANOSENSORS
11 December 202411 December 2024
Science & Technology

Fig. 1 a and b from Alexina Ollier et al 2023 “Energy dissipation on magic angle twisted bilayer graphene”: Pendulum atomic force microscope (p-AFM) tip oscillating on top of a twisted bilayer graphene (tBLG) device is measuring energy loss. a schematics of the measured device. The sample is composed of a p-doped silicon backgate (dark gray), followed by a 300 nm thick silicon dioxide layer (violet) and 10 nm hexagonal boron nitride (hBN, light blue). From the top tBLG is encapsulated with 10nm hBN film. b p-AFM image of the tBLG device, the white dotted rectangle is the device with a size of 4.1 μm × 5.8 μm. NANOSENSORS AdvancedTEC ATEC-CONT tip-view AFM probes were used.

Traditional Joule dissipation omnipresent in today’s electronic devices is well understood while the energy loss of the strongly interacting electron systems remains largely unexplored. Twisted… Read More »Energy dissipation on magic angle twisted bilayer graphene

Light-Induced Ferroelectric Modulation of p-n Homojunctions in Monolayer MoS2

Figure 3 from Mariola O Ramirez et al. 2024 “Light-Induced Ferroelectric Modulation of p-n Homojunctions in Monolayer MoS2”: c) Dark intensity-voltage (I–V) curves measured contacting the 1L-MoS2 by using two Pt-coated tips on a same single domain surface (blue) and both sides of a single domain wall (red). Schematics of the experimental configuration are shown in the right panels. Conductive NANOSENSORS™ AdvancedTEC™ ATEC-EFM tip-view AFM probes with a nominal stiffness of 2.8 N m−1 were used for the electrical characterization ensuring real tip visibility from above for a soft and accurate mechanical and electrical contact. To characterize the electrical properties of the system, the ATEC-EFM AFM probes were brought into direct contact with the MoS2 flakes please check the NANOSENSORS blogpost or the full article for the complete figure 3

In the last years, Transition Metal Dichalcogenides (TMDs) -based p-n junctions have been extensively studied and a variety of prototypes such as light-emitting diodes, photodetectors,… Read More »Light-Induced Ferroelectric Modulation of p-n Homojunctions in Monolayer MoS2

Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

by NANOSENSORS
16 February 2024
Science & Technology

It is always exiting to see what our creative and innovative users are doing with our AFM probes. In their article “Electron-beam lithography of nanostructures… Read More »Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)

by NANOSENSORS
7 December 202215 March 2023
Science & Technology

Figure 2 from A. P. Fellows et al “Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)”: AFM-IR data obtained from a human hair cross-section (approx. 300 nm thick) showing (a) a schematic structural representation of the cortical cell (b) average spectra corresponding to each observed region (macrofibril and Ext-matrix) (c) AFM height map and (d)-(l) IR-intensity maps recorded in contact mode across a 2.5 × 2.5 μm region of the surface at a number of different infrared frequencies corresponding to contributions observed in the spectra (each shown above the corresponding image) for a representative fibre section. NANOSENSORS AdvancedTEC ATEC-CONTAu tip view AFM probes were used.

The structure of hair fibres has been the focus of much research over the last century with several techniques used to investigate their structure. *… Read More »Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)

Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2

by NANOSENSORS
28 November 202215 March 2023
Science & Technology

Figure 4 from by “Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2” Monica Luna et al : Topography (top) and VCPD (bottom) images of a 3 nm diameter Au NP on bare TiO2(110) (a) in the dark and (b) under UV illumination. VCPD profiles are shown at the bottom. Color scale in topography: (a) 3.6 nm and (b) 4 nm. A CPD image of a larger sample area can be found in the Supporting Information (Figure S10). NANOSENSORS tip view conductive AdvancedTEC ATEC-EFM AFM probes were used.

Numerous advances of societal significance, such as CO2 conversion to fuels, hydrogen production by water splitting, and new materials with self-cleaning and antifogging properties, are… Read More »Photoinduced Charge Transfer and Trapping on Single Gold Metal Nanoparticles on TiO2

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform

by NANOSENSORS
8 January 202015 March 2023
Science & Technology

One important building block for future integrated nanophotonic devices is the scalable on-chip interfacing of single photon emitters and quantum memories with single optical modes.*… Read More »On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform