In their article “Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers” Lauren M. Otto, D. Frank Ogletree, Shaul Aloni,… Read More »Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers
In their research article “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering” Xiaolong Kou, Qian Zhou, Dong Wang, Jinghe Yuan, Xiaohong Fang and… Read More »High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering
A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain… Read More »Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films
アドバンスドテックシリーズはシャープな三角錐の探針がカンチレバー先端より更に前方へと突き出ているのが特長。 探針を確実に測定領域にポジショニングしたい場合や、探針先端を直接見ながら作業するナノマニピュレーションなどのアプリケーションに最適です。 Screencasts on the NANOSENSORS AdvancedTEC tip view AFM probes are also available in English:
For the full brochure please follow this link: http://www.nanosensors.com/pdf/AdvancedTEC.pdf
Product Screencast on the NANOSENSORS™ AdvancedTEC™ – Advanced Tip at the End of the Cantilever – High Resolution Silicon AFM Probes held by product developer Dr. Oliver Krause.
Read More »Product screencast NANOSENSORS™ AdvancedTEC™ AFM probes
We would like to thank our customers for their overwhelming interest in this new product and for their enthusiastic feedback. The AdvancedTEC™ probe will be… Read More »NANOSENSORS™ AdvancedTEC™ Silicon-SPM-probes for Contact Mode, Non-Contact and Force Modulation Mode are now available