AFMプローブ
Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation
Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications… Read More »Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation
On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform
One important building block for future integrated nanophotonic devices is the scalable on-chip interfacing of single photon emitters and quantum memories with single optical modes.*… Read More »On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform
Season’s Greetings from NANOSENSORS AFM probes
The first reindeer have been spotted! This is a sure sign that it is again time to wish all users of our AFM probes Happy… Read More »Season’s Greetings from NANOSENSORS AFM probes
Visit us at JASIS 2019 this week
Don’t forget to visit us @NanoAndMore Japan booth 6A-402 in hall 6 at #JASIS2019 this week and let them explain with their fancy new #AFMtip… Read More »Visit us at JASIS 2019 this week