AFMプローブ

Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

by NANOSENSORS
5 October 202015 March 2023
Science & Technology

Figure 5. from “Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles” by Huan Fei Wen et al. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). - Ultrastiff NANOSENSORS SD-T10L100 AFM probes were used.

In the article “Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy” Huan Fei Wen, Yasuhiro Sugawara and Yan Jun describe how… Read More »Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

Plant-Based Scaffolds Modify Cellular Response to Drug and Radiation Exposure Compared to Standard Cell Culture Models

by NANOSENSORS
7 September 202015 March 2023
Science & Technology

Plant-based scaffolds present many advantages over a variety of biomaterials.* Recent studies explored their potential to be repopulated with human cells and thus highlight a… Read More »Plant-Based Scaffolds Modify Cellular Response to Drug and Radiation Exposure Compared to Standard Cell Culture Models

Electric-field-driven non-volatile multi-state switching of individual skyrmions in a multiferroic heterostructure

by NANOSENSORS
24 August 202015 March 2023
Science & Technology

Figure 2 from “Electric-field-driven non-volatile multi-state switching of individual skyrmions in a multiferroic heterostructure” by Yadong Wang et al.: Electric-field-induced switching of individual skyrmion. The transferred average strain εave and corresponding magnetic domain evolution processes in the d ~ 350 nm a [Pt/Co/Ta]12 and b [Pt/Co/Ta]8 nano-dots in a cycle of E ranging from +10 to −10 kV cm−1. Positive εave (red dots) represents tensile strain while negative εave (blue dots) represents compressive strain. μ0H represents the external magnetic field except that from the MFM tip and here μ0H is equal to be 0 mT. The inset of b illustrates the spin texture of the magnetic domain that is encompassed by the red box. The stripe domain enclosed by the black box shows the initial state of the magnetic domain evolution path. The gray dots represent the corresponding electric field for the MFM images. The MFM contrast represents the MFM tip resonant frequency shift (Δf). The scale bar represents 250 nm. NANOSENSORS™ PPP-LM-MFMR low moment magnetic AFM probes were used

Electrical manipulation of skyrmions attracts considerable attention for its rich physics and promising applications. To date, such a manipulation is realized mainly via spin-polarized current… Read More »Electric-field-driven non-volatile multi-state switching of individual skyrmions in a multiferroic heterostructure

Insights into dynamic sliding contacts from conductive atomic force microscopy

by NANOSENSORS
12 August 202015 March 2023
Science & Technology

Figure 1 (a) from “Insights into dynamic sliding contacts from conductive atomic force microscopy” by Nicholas Chan et al: A schematic of the experimental setup is shown in Fig. 1(a). The experiment was conducted using an ultra-high vacuum (UHV)AFM at room temperature at a pressure of

Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating… Read More »Insights into dynamic sliding contacts from conductive atomic force microscopy

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

by NANOSENSORS
6 August 202015 March 2023
Inside NANOSENSORS, News & Events, Videos

The screencast on the soft, drift-reduced NANOSENSORS™ uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 1000… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

Happy Swiss National Holiday with Smallest Swiss Cross

by NANOSENSORS
1 August 202015 March 2023
News & Events

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PointProbePlus PPP-NCL AFM probe was used for this image)

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy