NANOSENSORS proudly sponsors the 20th International Conference on Non-Contact Atomic Force Microscopy taking place in Suzhou, P.R. China from September 25th to September 29th, 2017.… Read More »NANOSENSORS proudly sponsors Non-Contact AFM Conference
NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the… Read More »Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
アドバンスドテックシリーズはシャープな三角錐の探針がカンチレバー先端より更に前方へと突き出ているのが特長。 探針を確実に測定領域にポジショニングしたい場合や、探針先端を直接見ながら作業するナノマニピュレーションなどのアプリケーションに最適です。 Screencasts on the NANOSENSORS AdvancedTEC tip view AFM probes are also available in English:
Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PPP-NCL was used for this image)
NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 500 views mark Accurately determined cantilever properties are very important for… Read More »Calibration Service for AFM Cantilevers
