Standard SiN AFM probes may have a lot of advantages for using them in your liquid cell measurements. But they also have their limits when… Read More »Spike up a Silicon Nitride AFM tip for high topography biology and life science imaging
The screencast on the self-sensing self-actuating Akiyama Probe (A-Probe) held by Dr. Terunobu Akiyama on https://www.youtube.com/watch?v=-mrs_-soChY has just passed the 1000 views mark. Congratulations Akiyama-san!
The NANOSENSORS screencast on SuperSharp Silicon AFM tips for high resolution imaging is now available in Chinese on youtube and youku http://v.youku.com/v_show/id_XOTIzNjg0NDQ0.html . NANOSENSORS公司的吴烨娴博士在本视频中介绍了SuperSharpSilicon原子力显微镜探针。SSS超尖硅针尖是为超高精度的原子力显微 镜成像设计的。它适用于超精细结构，如小于10nm特征粗糙度表面的测量。该探针基于NANOSENSORS的标准AFM探针 PointProbePlus系统。在一个特殊的尖端锐化过程后，针尖半径由7nm减小为2nm。… Read More »视频介绍 – SuperSharpSilicon原子力显微镜探针 – NANOSENSORS™
Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?
For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).
Read More »NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications
Christoph Richter from NANOSENSORS™ R&D department is talking in this screencast about his latest development: AFM Cantilevers for Scanning Electrochemical Microscopy. These are the very… Read More »NANOSENSORS™: AFM Cantilevers for Scanning Electrochemical Microscopy
NANOSENSORS has added a new type of rounded AFM tips to the Special Development List. The new rounded AFM tips SD-R30 have a typical tip… Read More »Rounded AFM Tips for Nanomechanics and Force Spectroscopy – Special Development List updated
Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM probes… Read More »High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes