NANOSENSORS PointProbePlusプローブ
走査型プローブ顕微鏡(SPM)および原子間力顕微鏡(AFM)に使われるプローブ/カンチ レバーには選択に困るほど数多くの種類があります。だからこそ、まずはこれをお使 いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」 に求められる高品質と高精度を備え幅広いアプリケーションにご利用頂けます。 https://youtu.be/4eiL8lpQ3fE
AFM Probes
Happy Birthday Atomic Force Microscope!
30 years ago, on March 3rd 1986, Gerd Binnig, Carl Quate and Christoph Gerber published a paper simply titled Atomic Force Microscope. Happy Birthday! Reprinted… Read More »Happy Birthday Atomic Force Microscope!
Visit us at MRS Fall next week
Don’t forget to mark in your calendar to come and find us at NanoAndMore booth 610 at MRS Fall in Boston next week. The exhibition… Read More »Visit us at MRS Fall next week
NANOSENSORS 公司 – 原子力显微镜探针的发展史
The screencast on the history of NANOSENSORS AFM probes is now available in Chinese on youtube and youku NANOSENSORS 公司 – 原子力显微镜探针的发展史 在 Youtube 和在… Read More »NANOSENSORS 公司 – 原子力显微镜探针的发展史
NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution
Dr. Oliver Krause, product developer at NANOSENSORS™ is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic… Read More »NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution
Visit us at Toyo booth 4B-705 at JASIS in Makuhari, Japan this week
Visit us at Toyo booth 4B-705 at JASIS 2015 in Makuhari, Japan this week.
We’re in Beijing this week, you too?
We will be attending the China Nano 2015 in Beijing this week from September 3-5, 2015 and can also be found in the exhibition hall… Read More »We’re in Beijing this week, you too?