Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?
For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).
Read More »NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications
Christoph Richter from NANOSENSORS™ R&D department is talking in this screencast about his latest development: AFM Cantilevers for Scanning Electrochemical Microscopy. These are the very… Read More »NANOSENSORS™: AFM Cantilevers for Scanning Electrochemical Microscopy
NANOSENSORS has added a new type of rounded AFM tips to the Special Development List. The new rounded AFM tips SD-R30 have a typical tip… Read More »Rounded AFM Tips for Nanomechanics and Force Spectroscopy – Special Development List updated
Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM probes… Read More »High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory got impressive Scanning Electrochemical AFM measurement results captured with EC-AFM probes developed and manufactured by… Read More »High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
Learn more about the NANOSENSORS uniqprobes for biology and life science applications at the NanoAndMore booth no. 469 at the Biophysics Meeting in Baltimore this… Read More »Visit our distributor NanoAndMore USA at booth no. 469 at Biophys
NANOSENSORS™ screencast on the service for Calibration for AFM Cantilevers, presented by Wolfgang Engl. Accurately determined cantilever properties are very important for quantitative force measurements.… Read More »Calibration service for AFM Cantilever