The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 500 views mark Accurately determined cantilever properties are very important for… Read More »Calibration Service for AFM Cantilevers
In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to… Read More »Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark
The screencast on the soft, drift-reduced NANOSENSORS uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 500… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 500 views mark
