NANOSENSORS PointProbePlusプローブ
走査型プローブ顕微鏡(SPM)および原子間力顕微鏡(AFM)に使われるプローブ/カンチ レバーには選択に困るほど数多くの種類があります。だからこそ、まずはこれをお使 いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」 に求められる高品質と高精度を備え幅広いアプリケーションにご利用頂けます。 https://youtu.be/4eiL8lpQ3fE
AFM
NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution
Dr. Oliver Krause, product developer at NANOSENSORS™ is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic… Read More »NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution
Visit us at Toyo booth 4B-705 at JASIS in Makuhari, Japan this week
Visit us at Toyo booth 4B-705 at JASIS 2015 in Makuhari, Japan this week.
Spike up a Silicon Nitride AFM tip for high topography biology and life science imaging
Standard SiN AFM probes may have a lot of advantages for using them in your liquid cell measurements. But they also have their limits when… Read More »Spike up a Silicon Nitride AFM tip for high topography biology and life science imaging
Visit our distributor NanoAndMore USA at booth no. 469 at Biophys
Learn more about the NANOSENSORS uniqprobes for biology and life science applications at the NanoAndMore booth no. 469 at the Biophysics Meeting in Baltimore this… Read More »Visit our distributor NanoAndMore USA at booth no. 469 at Biophys
Calibration service for AFM Cantilever
NANOSENSORS™ screencast on the service for Calibration for AFM Cantilevers, presented by Wolfgang Engl. Accurately determined cantilever properties are very important for quantitative force measurements.… Read More »Calibration service for AFM Cantilever