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Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy