biological physics

Distinct Contact Guidance Mechanisms in Single Endothelial Cells and in Monolayers

Supplementary Figure 10 from Claire Leclech et al. (2023) “Distinct Contact Guidance Mechanisms in Single Endothelial Cells and in Monolayers”: Characterization of the secreted basement membrane. (C) Surface topography and stiffness (Young’s modulus) obtained by atomic force microscopy of the secreted ECM or bare PDMS after 72 h of culture on flat surfaces coated with fibronectin (FN) or poly-L-lysine (PLL). Dots represent individual measures on n=2 independent experiments. Error bars represent standard deviations. Please follow the link to the full article to find the full supplementary figure 10 and its description. Atomic Force Microscopy measurements were performed using an AFM probe with circular symmetric rounded AFM tip with typical radius of curvature around 30 nm (0.03–0.09 N m−1) (uniqprobe qp-BIOAC-CI, from NANOSENSORS).

In many tissues, cell shape and orientation are controlled by a combination of internal and external biophysical cues. * Cell shape is closely controlled in… Read More »Distinct Contact Guidance Mechanisms in Single Endothelial Cells and in Monolayers

Elastic shell theory for plant cell wall stiffness reveals contributions of cell wall elasticity and turgor pressure in AFM measurement

by NANOSENSORS
4 August 202215 March 2023
Science & Technology

Fig-3-S-Tsugawa-et-al-2022-Elastic-shell-theory-for-plant-cell-wall-stiffness-reveals-contributions-of-cell-wall-elasticity-and-turgor-pressure-in-AFM-measurement NANOSENSORS Sphere-AFM probes SD-Sphere-NCH-S from the NANOSENSORS™ Special Developments List were used for the force-indentation curve measurements with atomic force microscopy

The stiffness of a plant cell in response to an applied force is determined not only by the elasticity of the cell wall but also… Read More »Elastic shell theory for plant cell wall stiffness reveals contributions of cell wall elasticity and turgor pressure in AFM measurement

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

by NANOSENSORS
9 June 202015 March 2023
Science & Technology

Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences : Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot

Correlating data from different microscopy techniques holds the potential to discover new facets of signalling events in cellular biology.* In the article “Simultaneous co-localized super-resolution… Read More »Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences