conductive diamond coated AFM probes

High-Performance and Lithography-Free Au/WS2/Ag Vertical Schottky Junction Solar Cells

Transition metal dichalcogenide (TMD) semiconductors (SCs) exhibit intriguing optical, electrical, and mechanical properties. * Due to their extraordinarily large optical absorption coefficients, transition metal dichalcogenides… Read More »High-Performance and Lithography-Free Au/WS2/Ag Vertical Schottky Junction Solar Cells

Insights into dynamic sliding contacts from conductive atomic force microscopy

by NANOSENSORS
12 August 202015 March 2023
Science & Technology

Figure 1 (a) from “Insights into dynamic sliding contacts from conductive atomic force microscopy” by Nicholas Chan et al: A schematic of the experimental setup is shown in Fig. 1(a). The experiment was conducted using an ultra-high vacuum (UHV)AFM at room temperature at a pressure of

Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating… Read More »Insights into dynamic sliding contacts from conductive atomic force microscopy

Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials

by NANOSENSORS
7 April 201915 March 2023
Science & Technology

Figure 4 from “Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials” by Amir Abdollahi et al.: Study of converse flexoelectricity induced at the tip apex of an atomic force microscope cantilever as a function of the applied force. a Effective piezoelectric coefficient as a function of applied force for the SrTiO3 crystal. Filled squares correspond to the values obtained after the simulation. Empty circles correspond to the experimental values obtained with a NANOSENSORS CDT-FM AFM tip with a cantilever of medium stiffness (k ≈ 2.8 Nm−1) coated with doped diamond. The error bars correspond to the error of the linear fitting of the experimental data, which correlates the measured electromechanical amplitude of oscillation Δh with the Vac applied voltage. b The effective contact radius a scales with the force, and is determined by the tip radius. The experimental tip radius is obtained after the measurement of the nanoscale electromechanical response from the scanning electron microscopy image of the used tip. In this case, the tip radius of the diamond coated tip is 105 nm, and is observed to keep a spherical shape after the measurements

NANOSENSORS™ conductive diamond coated CDT-NCLR AFM probes were used for the piezoresponse force microscopy ( PFM ) on non-piezoelectric dielectrics described in this brand new… Read More »Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials