Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available
NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available