Christoph Richter from NANOSENSORS™ R&D department is talking in this screencast about his latest development: AFM Cantilevers for Scanning Electrochemical Microscopy. These are the very… Read More »NANOSENSORS™: AFM Cantilevers for Scanning Electrochemical Microscopy
Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM probes… Read More »High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory got impressive Scanning Electrochemical AFM measurement results captured with EC-AFM probes developed and manufactured by… Read More »High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
NANOSENSORS™ not only uses its know-how to manufacture its well-known standard products. We at NANOSENSORS™ are doing research on many possible future AFM applications and… Read More »NANOSENSORS™ – the Special Development List