A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain… Read More »Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films
NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the… Read More »Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls