The properties and performance of polycrystalline materials depend critically on the properties of their grain boundaries.* In the article “Direct evidence for grain boundary passivation… Read More »Direct evidence for grain boundary passivation in Cu(In,Ga)Se2 solar cells through alkali-fluoride post-deposition treatments
Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation… Read More »Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures
“In the ferroelectric devices, polarization control is usually accomplished by application of an electric field.”* In the article “Optical control of polarization in ferroelectric heterostructures”… Read More »Optical control of polarization in ferroelectric heterostructures
In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese. NANOSENSORS™ Platinum Silicide AFM probes are designed for… Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)
Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)
Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.