KPFM

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

by NANOSENSORS
19 January 202015 March 2023
Science & Technology

Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications… Read More »Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

Direct evidence for grain boundary passivation in Cu(In,Ga)Se2 solar cells through alkali-fluoride post-deposition treatments

by NANOSENSORS
10 September 201915 March 2023
Science & Technology

The properties and performance of polycrystalline materials depend critically on the properties of their grain boundaries.* In the article “Direct evidence for grain boundary passivation… Read More »Direct evidence for grain boundary passivation in Cu(In,Ga)Se2 solar cells through alkali-fluoride post-deposition treatments

Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures

by NANOSENSORS
18 August 201915 March 2023
Science & Technology

Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation… Read More »Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures

Optical control of polarization in ferroelectric heterostructures

by NANOSENSORS
17 December 201815 March 2023
Science & Technology

Figure 1 from “Optical control of polarization in ferroelectric heterostructures”: Electrically induced polarization switching in the MoS2/BaTiO3/SrRuO3 junction. a, b PFM phase (a) and amplitude (b) images after application of a negative voltage pulse (−5 V, 0.5 s) to the MoS2 flake. The 12-u.c.-thick BTO film underneath the MoS2 flake is fully switched to the upward polarization, Pup. c, d PFM phase (c) and amplitude (d) images after application of several positive voltage pulses (+5 V, 0.5 s) to the MoS2 flake. BTO underneath the MoS2 flake is fully switched to downward polarization, Pdown. The polarization state of the bare BTO film (at the lower right corner) is not affected by the electrical bias. e, f The I–V characteristics of the same junction measured in the dark and during illumination. The tunneling current for the OFF state (Pup) is largely increased under illumination. Silicon AFM probes with Pt/Ir conductive coating and nominal stiffness of 3 N m−1 (PPP-EFM, NANOSENSORS) were used to perform the KPFM and PFM measurements.

“In the ferroelectric devices, polarization control is usually accomplished by application of an electric field.”* In the article “Optical control of polarization in ferroelectric heterostructures”… Read More »Optical control of polarization in ferroelectric heterostructures

Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

by NANOSENSORS
4 December 201815 March 2023
Science & Technology

Figure 1 from "Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy": Schematic of the experimental setup, NANOSENSORS PPP-NCST-Pt AFM probes were used

In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

by NANOSENSORS
19 June 201715 March 2023
Science & Technology

Figure 1: OTFT structure and setup for force microscopy on bent substrates. From: T. Cramer et. al.Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)

by NANOSENSORS
3 March 201515 March 2023
News & Events, Videos

Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese. NANOSENSORS™ Platinum Silicide AFM probes are designed for… Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)