Product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ given by Dr. Oliver Krause. NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required.
Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes
NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available
NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series