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Laser alignment

NANOSENSORS™ introduces next generation XY-Alignment AFM probe – easy tip exchange without laser repositioning

NANOSENSORS™ today introduced its new PointProbe® Plus XY-Alignment series.

The invention of the Alignment Chip by NANOSENSORS™ more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.

Read More »NANOSENSORS™ introduces next generation XY-Alignment AFM probe – easy tip exchange without laser repositioning