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Magnetic Force Microscopy probe

Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes

Figure 12 from: A. Krivcov et. al, Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution: Figure 12. (a) topography of copper substrate with single magnetite nanoparticle; (b) phase image in 11 nm lift height with an attraction at the place of the nanoparticle; (c) Cross section of a single magnetite nanoparticle (dotted line in (a)) with 10 nm diameter taken on copper substrate with NANOSENSORS SSS-MFMR AFM probe

In their publication “Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution” Alexander Krivcov, Tanja Junkers and Hildegard Möbius describe… Read More »Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes

NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications

NANOSENSORS Q30K-Plus AFM probes for applications in ultra high vacuum

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

Read More »NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications